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Topography simulation for the virtual wafer fab
by
Cale, Timothy S.
,
Merchant, Tushar P.
,
Borucki, Leonard J.
,
Labun, Andrew H.
Published in
Thin solid films
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Etching of polysilicon in inductively coupled Cl2 and HBr discharges. I. Experimental characterization of polysilicon profiles
by
Mahorowala, Arpan P.
,
Sawin, Herbert H.
,
Jones, Richard
,
Labun, Andrew H.
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Mechanistic feature-scale profile simulation of SiO2 low-pressure chemical vapor deposition by tetraethoxysilane pyrolysis
by
Labun, Andrew H.
,
Moffat, Harry K.
,
Cale, Timothy S.
Published in
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
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Topography simulation for the virtual wafer fab: Process and materials modeling in IC fabrication
by
CALE, Timothy S
,
MERCHANT, Tushar P
,
BORUCKI, Leonard J
,
LABUN, Andrew H
Published in
Thin solid films
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Article
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Etching of polysilicon in inductively coupled Cl 2 and HBr discharges. I. Experimental characterization of polysilicon profiles
by
Mahorowala, Arpan P.
,
Sawin, Herbert H.
,
Jones, Richard
,
Labun, Andrew H.
Published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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Article
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Mechanistic feature-scale profile simulation of SiO 2 low-pressure chemical vapor deposition by tetraethoxysilane pyrolysis
by
Labun, Andrew H.
,
Moffat, Harry K.
,
Cale, Timothy S.
Published in
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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Article
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