ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Ar n + , C 60 ++ , and Cs + Sputtering Ions by Terlier, T, Zappalà, G, Marie, C, Leonard, D, Barnes, J-P, Licciardello, A

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ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Arn+, C60++, and Cs+ Sputtering Ions by Terlier, T, Zappal, G, Marie, C, Leonard, D, Barnes, J-P, Licciardello, A

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Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers by Zappalà, G., Motta, V., Tuccitto, N., Vitale, S., Torrisi, A., Licciardello, A.

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Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing by Havelund, R, Licciardello, A, Bailey, J, Tuccitto, N, Sapuppo, D, Gilmore, I S, Sharp, J S, Lee, J L S, Mouhib, T, Delcorte, A

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Supramolecular self-assembled multilayers of terpyridine-functionalized perylene bisimide metal complexes by TUCCITTO, N, DELFANTI, I, TORRISI, V, SCANDOLA, F, CHIORBOLI, C, STEPANENKO, V, WÜRTHNER, F, LICCIARDELLO, A

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ToF-SIMS investigation of FIB-patterning of lactoferrin by using self-assembled monolayers of iron complexes by Tuccitto, N., Giamblanco, N., Marletta, G., Licciardello, A.

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Pulsed rf-GD-TOFMS for depth profile analysis of ultrathin layers using the analyte prepeak region by Pisonero, J., Valledor, R., Licciardello, A., Quirós, C., Martín, J. I., Sanz-Medel, A., Bordel, N.

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Polymer screening by radiofrequency glow discharge time-of-flight mass spectrometry by Lobo, L, Tuccitto, N, Bordel, N, Pereiro, R, Pisonero, J, Licciardello, A, Tempez, A, Chapon, P, Sanz-Medel, A

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Minor elements determination and evaluation of diffusion/segregation effects on ultra-thin layers using pulsed-RF-GD-TOFMS by Pisonero, J., Licciardello, A., Hierro-Rodríguez, A., Quirós, C., Sanz-Medel, A., Bordel, N.

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Monoatomic and cluster beam effect on ToF-SIMS spectra of self-assembled monolayers on gold by Tuccitto, N., Torrisi, V., Delfanti, I., Licciardello, A.

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Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses by Muñiz, A. C., Pisonero, J., Lobo, L., Gonzalez, C., Bordel, N., Pereiro, R., Tempez, A., Chapon, P., Tuccitto, N., Licciardello, A., Sanz-Medel, A.

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ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces by Spampinato, V., Vitale, S., Quici, S., Torrisi, A., Stepanenko, V., Würthner, F., Licciardello, A.

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Corrosion of NiTi instruments by contact with sodium hypochlorite in clinical simulated conditions: TOF-Sims analysis by Pedulla’, E, Cicciu’, M, Licciardello, A, Rapisarda, E

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ToF-SIMS imaging of surface self-organized fractal patterns of bacteria by Tuccitto, N., Marletta, G., Carnazza, S., Grasso, L., Caratozzolo, M., Guglielmino, S., Licciardello, A.

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Nano- and microstructured polymer LB layers: A combined AFM/SIMS study by Torrisi, V., Tuccitto, N., Delfanti, I., Audinot, J.N., Zhavnerko, G., Migeon, H.-N., Licciardello, A.

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Surface anchoring of a chiral salen macrocycle on a carboxy-functionalized platform via a multiple site esterification by Torrisi, V., Amato, M. E., Ballistreri, F. P., Tomaselli, G., Toscano, R. M., Licciardello, A.

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Comparison between angular dependent NEXAFS analysis and theoretical calculations of molecular orientation of new functional mixed aromatic molecules deposited onto Au/Si(111) by Battocchio, C., Polzonetti, G., Gambino, L., Tuccitto, N., Licciardello, A., Marletta, G.

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Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness by Trigoulet, N., Tuccitto, N., Delfanti, I., Licciardello, A., Molchan, I. S., Skeldon, P., Thompson, G. E., Tempez, A., Chapon, P.

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Chemical effects in C60 irradiation of polymers by MÖLLERS, R, TUCCITTO, N, TORRISI, V, NIEHUIS, E, LICCIARDELLO, A

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Differentiation of 18O- and 16O-rich layers in anodic alumina films by glow discharge time-of-flight mass spectroscopy by Molchan, I. S., Thompson, G. E., Skeldon, P., Trigoulet, N., Tempez, A., Chapon, P., Tuccitto, N., Licciardello, A.

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