Search Results - LOGVINSKY, L. M

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    XPS study of ion-beam-assisted formation of Si nanostructures in thin SiO2 layers

    XPS study of ion-beam-assisted formation of Si nanostructures in thin SiO2 layers by Kesler, V. G., Yanovskaya, S. G., Kachurin, G. A., Leier, A. F., Logvinsky, L. M.

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    XPS study of ion‐beam‐assisted formation of Si nanostructures in thin SiO 2 layers

    XPS study of ion‐beam‐assisted formation of Si nanostructures in thin SiO 2 layers by Kesler, V. G., Yanovskaya, S. G., Kachurin, G. A., Leier, A. F., Logvinsky, L. M.

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    XPS study of ion-beam-assisted formation of Si nanostructures in thin SiO2 layers

    XPS study of ion-beam-assisted formation of Si nanostructures in thin SiO2 layers by KESLER, V. G, YANOVSKAYA, S. G, KACHURIN, G. A, LEIER, A. F, LOGVINSKY, L. M

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