Search Results - Laabs, Francis C.

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  1. 1
    A statistical analysis of the variation in measured crystal orientations obtained through electron backscatter diffraction

    A statistical analysis of the variation in measured crystal orientations obtained through electron backscatter diffraction by Bingham, Melissa A., Lograsso, Barbara K., Laabs, Francis C.

    Published in Ultramicroscopy
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  2. 2
    Interfacial adhesion mechanisms in incompatible semicrystalline polymer systems

    Interfacial adhesion mechanisms in incompatible semicrystalline polymer systems by Lo, Chieh-Tsung, Laabs, Francis C., Narasimhan, Balaji

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  3. 3
    Analysis of rare earth materials by cathodoluminescence spectra excited by an electron microprobe

    Analysis of rare earth materials by cathodoluminescence spectra excited by an electron microprobe by Kniseley, Richard N, Laabs, Francis C, Fassel, Velmer A

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  4. 4
    The development of dislocation substructure in hydrogen embrittled niobium-8 to 10 at % vanadium alloy: Part 1

    The development of dislocation substructure in hydrogen embrittled niobium-8 to 10 at % vanadium alloy: Part 1 by Jagannadham, K., Laabs, Francis C.

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  5. 5
    Dislocation substructure inin situ deformed foils of niobium-8 to 10 at % vanadium alloy: Part 2

    Dislocation substructure inin situ deformed foils of niobium-8 to 10 at % vanadium alloy: Part 2 by Jagannadham, K., Laabs, Francis C.

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  6. 6
    Improved Electron Beam Scanning System for Electron Microprobe X‐Ray Analyzers

    Improved Electron Beam Scanning System for Electron Microprobe X‐Ray Analyzers by Kniseley, Richard N., Laabs, Francis C., Van Zuuk, Dean

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