Search Results - Ladhar, Aymen

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  1. 1
    A comprehensive framework for cell-aware diagnosis of customer returns

    A comprehensive framework for cell-aware diagnosis of customer returns by d'Hondt, P., Mhamdi, S., Girard, P., Virazel, A., Ladhar, A.

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  2. 2
    A Comprehensive Learning-Based Flow for Cell-Aware Model Generation

    A Comprehensive Learning-Based Flow for Cell-Aware Model Generation by D'Hondt, P., Ladhar, A., Girard, P., Virazel, A.

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  3. 3
    A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns

    A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns by Mhamdi, S., Girard, P., Virazel, A., Bosio, A., Ladhar, A.

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  4. 4
    A Learning-Based Methodology for Accelerating Cell-Aware Model Generation

    A Learning-Based Methodology for Accelerating Cell-Aware Model Generation by d'Hondt, P., Ladhar, A., Girard, P., Virazel, A.

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  5. 5
    An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis

    An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis by Ladhar, Aymen, Masmoudi, Mohamed

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  6. 6
    Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data

    Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data by Ladhar, A., Masmoudi, M., Bouzaida, L.

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  7. 7
    On Using Cell-Aware Methodology for SRAM Bit Cell Testing

    On Using Cell-Aware Methodology for SRAM Bit Cell Testing by Xhafa, X., Ladhar, A., Faehn, E., Anghel, L., Di Pendina, G., Girard, P., Virazel, A.

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  8. 8
    Learning-Based Cell-Aware Defect Diagnosis of Customer Returns

    Learning-Based Cell-Aware Defect Diagnosis of Customer Returns by Mhamdi, S., Girard, P., Virazel, A., Bosio, A., Ladhar, A.

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  9. 9
    Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip

    Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip by Mhamdi, S., Virazel, A., Girard, P., Bosio, A., Auvray, E., Faehn, E., Ladhar, A.

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  10. 10
    A novel algorithm to extract open defects from industrial designs

    A novel algorithm to extract open defects from industrial designs by Ladhar, A., Masmoudi, M.

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  11. 11
    Analysis and diagnosis of multiple simultaneous defects

    Analysis and diagnosis of multiple simultaneous defects by Ladhar, A., Masmoudi, M.

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  12. 12
    Extraction of open-via defects from industrial designs

    Extraction of open-via defects from industrial designs by Ladhar, A., Masmoudi, M.

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  13. 13
    Extraction and simulation of potential bridging faults and open defects affecting standard cell libraries

    Extraction and simulation of potential bridging faults and open defects affecting standard cell libraries by Ladhar, A., Masmoudi, M., Bouzaida, L.

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  14. 14
    A new approach to diagnose multiple simultaneous defects

    A new approach to diagnose multiple simultaneous defects by Ladhar, A., Izaute, I., Masmoudi, M.

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  15. 15
    Layout based method to diagnose intra-gate defects in presence of multiple-fault

    Layout based method to diagnose intra-gate defects in presence of multiple-fault by Ladhar, A., Bouzaida, L., Masmoudi, M.

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  16. 16
    Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

    Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning by Mhamdi, Safa, Girard, Patrick, Virazel, Arnaud, Bosio, Alberto, Faehn, Eric, Ladhar, Aymen

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