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Static Characterization On-State of an Industrial Si Power MOSFET at Cryogenic Temperature
by
Laib, Yanis
,
Berger, Kevin
,
Rael, Stephane
,
Leveque, Jean
,
Viguier, Christophe
,
El-Wakeel, Abdelrahman
,
Zhang, Min
Published in
IEEE transactions on applied superconductivity
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Ieee Transactions On Applied Superconductivity
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Avionics
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Condensed Matter
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Cryogenic Characterization
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Cryogenic Equipment
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Cryogenic Temperature
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Cryogenics
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Current Carriers
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Electric Potential
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Electrical Resistance Measurement
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Energy Consumption
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Engineering
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Engineering Sciences
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Logic Gates
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Mosfet
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Mosfets
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