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    Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions

    Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions by Flynn, Eric B, Bassman, Lori C, Smith, Timothy P, Lalji, Zamir, Fullerton, Laurel H, Leung, Tommy C, Greenfield, Scott R, Koskelo, Aaron C

    Published in Applied optics (2004)
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