Intracranial complications of acute frontal sinusitis by Lang, E.E., Curran, A.J., Patil, N., Walsh, R.M., Rawluk, D., Walsh, M.A.

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A retrospective review of stapes surgery following introduction of 'reversal of the steps' technique by Lang, E.E., Waheed, K., Colreavy, M., Burns, H.

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Search for elements 119 and 120 by Khuyagbaatar, J., Yakushev, A., Düllmann, Ch. E., Ackermann, D., Andersson, L.-L., Asai, M., Block, M., Boll, R. A., Brand, H., Cox, D. M., Dasgupta, M., Derkx, X., Di Nitto, A., Eberhardt, K., Even, J., Evers, M., Fahlander, C., Forsberg, U., Gates, J. M., Gharibyan, N., Golubev, P., Gregorich, K. E., Hamilton, J. H., Hartmann, W., Herzberg, R.-D., Heßberger, F. P., Hinde, D. J., Hoffmann, J., Hollinger, R., Hübner, A., Jäger, E., Kindler, B., Kratz, J. V., Krier, J., Kurz, N., Laatiaoui, M., Lahiri, S., Lang, R., Lommel, B., Maiti, M., Miernik, K., Minami, S., Mistry, A. K., Mokry, C., Nitsche, H., Omtvedt, J. P., Pang, G. K., Papadakis, P., Renisch, D., Roberto, J. B., Rudolph, D., Runke, J., Rykaczewski, K. P., Sarmiento, L. G., Schädel, M., Schausten, B., Semchenkov, A., Shaughnessy, D. A., Steinegger, P., Steiner, J., Tereshatov, E. E., Thörle-Pospiech, P., Tinschert, K., Torres De Heidenreich, T., Trautmann, N., Türler, A., Uusitalo, J., Wegrzecki, M., Wiehl, N., Van Cleve, S. M., Yakusheva, V.

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Evaluation of snow-surface energy balance models in alpine terrain by Fierz, C, Riber, P, Adams, E.E, Curran, A.R, Föhn, P.M.B, Lehning, M, Plüss, C

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Ion induced magnetization reorientation in Co/Pt multilayers for patterned media by Weller, D., Baglin, J. E. E., Kellock, A. J., Hannibal, K. A., Toney, M. F., Kusinski, G., Lang, S., Folks, L., Best, M. E., Terris, B. D.

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An optimal catalyst management strategy for Oxo processes by Lang, Y.-D., Biegler, L.T., Maier, E.E., Majewski, R.A.

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Power-delay characteristics of CMOS multipliers by Callaway, T.K., Swartzlander, E.E.

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Variation of background impurities in AlxGa1-xAs (0.3≤x≤0.4) with growth temperature : implications for device leakage current and surface/heterointerface roughness by CHAND, N, HARRIS, T. D, CHU, S. N. G, BECKER, E. E, SERGENT, A. M, SCHNOES, M, LANG, D. V

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Variation of background impurities in Al xGa 1−xAs (0.3 ≤ χ ≤ 0.4) with growth temperature: implications for device leakage current and surface/heterointerface roughness by Chand, Naresh, Harris, T.D., Chu, S.N.G., Becker, E.E., Sergent, A.M., Schnoes, M., Lang, D.V.

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Stimulated Raman scattering in an inorganic Nd Liquid laser by Lang, R.S., Baumhacker, H., Fill, E.E.

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