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Search Results - Lau, L.W.M.
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Different melting behavior of lead surfaces
by
Sun, D.Y.
,
Shu, D.J.
,
Gong, X.G.
,
Lau, L.W.M.
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Solid state communications
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Nature of traps in gate silicon oxynitride of MOS devices
by
Morokov, Yu.N.
,
Gritsenko, V.A.
,
Novikov, Yu.N.
,
Xu, J.B.
,
Lau, L.W.M.
,
Kwok, R.W.M.
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Charge transport and nature of traps in implanted silicon nitride
by
Gritsenko, V.A.
,
Morokov, Yu.N.
,
Xu, J.B.
,
Pridachin, N.B.
,
Kalinin, V.V.
,
Ng, A.C.
,
Lau, L.W.M.
,
Kwok, R.W.M.
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