Search Results - Lauritzen, Peter O.
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A test circuit for second breakdown suitable for routine measurements
Conference Proceeding -
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Optimum design and test of a snubberless IGBT PWM-VSI inverterbridge
Conference Proceeding -
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Power semiconductor device models for use in circuit simulators
Conference Proceeding -
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Goals for a basic level IGBT model with easy parameter extraction
Conference Proceeding -
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A simple power diode model with forward and reverse recovery
Conference Proceeding -
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