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    On the reliability of highly magnified micrographs for structural analysis in materials science

    On the reliability of highly magnified micrographs for structural analysis in materials science by Wortmann, Martin, Layland, Ashley Stephen, Frese, Natalie, Kahmann, Uwe, Grothe, Timo, Storck, Jan Lukas, Blachowicz, Tomasz, Grzybowski, Jacek, Hüsgen, Bruno, Ehrmann, Andrea

    Published in Scientific reports
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