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Effects of argon thermal annealing on surface structure, microstructural and silicide formation of Silicon-Titanium-Cobalt thin film
by
Mtshali, Christopher
,
Khumalo, Zakhelumuzi
,
Mocumi, Gladness
,
Lebesana, Keletso
,
Kheswa, Ntombizonke
,
Magogodi, Steven
,
Cummings, Francious
,
Pieters, Caswell
,
Nkosi, Mlungisi
Published in
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
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Nuclear Instruments & Methods In Physics Research. Section B, Beam Interactions With Materials And Atoms
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Cobalt-Titanium
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Electron Beam Evaporation
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In-Situ Rutherford Backscattering Spectrometry
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Instruments & Instrumentation
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Nuclear Science & Technology
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Physics, Atomic, Molecular & Chemical
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Physics, Nuclear
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Scanning Electron Microscope
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Silicides
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X-Ray Diffraction
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