Search Results - Lee, Donzella

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  1. 1
    Catalyzing Implementation of Evidence-Based Interventions in Safety Net Settings: A Clinical–Community Partnership in South Los Angeles

    Catalyzing Implementation of Evidence-Based Interventions in Safety Net Settings: A Clinical–Community Partnership in South Los Angeles by Payán, Denise D., Sloane, David C., Illum, Jacqueline, Vargas, Roberto B., Lee, Donzella, Galloway-Gilliam, Lark, Lewis, LaVonna B.

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  2. 2
    Characterization of frequent douchers attending a community clinic primarily serving African-American women

    Characterization of frequent douchers attending a community clinic primarily serving African-American women by SMITH, Lisa V, RUDY, Ellen T, IVIE, Sylvia D, LEE, Donzella, VISSCHER, Barbara, KERNDT, Peter

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  3. 3
    African-American physicians and smoking cessation counseling

    African-American physicians and smoking cessation counseling by BERMAN, B. A, YANCEY, A. K, BASTANI, R, GROSSER, S. C, STAVEREN, A, WILLIAMS, R. A, LEE, D

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    Post-adoption experiences of discrimination moderated by sleep quality are associated with depressive symptoms in previously institutionalized youth over and above deprivation-induced depression risk

    Post-adoption experiences of discrimination moderated by sleep quality are associated with depressive symptoms in previously institutionalized youth over and above deprivation-indu... by Morency, Mirinda M, Donzella, Bonny, Reid, Brie M, Lee, Richard M, Dengel, Donald R, Gunnar, Megan R

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  5. 5
    From operational design domain to test cases: A methodology to include harsh weather

    From operational design domain to test cases: A methodology to include harsh weather by Warg, Fredrik, Donzella, Valentina, Chan, Pak Hung, Robinson, Jonathan, Poledna, Yuri, Liandrat, Sebastien, Cihan, Umut, Aramrattana, Maytheewat, Lee, Graham, Erdal Aksoy, Eren

    Published in Open research Europe
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  6. 6
    Immersion lithography process improvements by wafer edge inspection at 300mm DRAM manufacturing fab

    Immersion lithography process improvements by wafer edge inspection at 300mm DRAM manufacturing fab by Strobl, M, Hsu, C, Yu Chen Lin, Chen, H, Chen, D, Cheng, A, WonGun Lee, Lin, S, Donzella, O, Leung, R, Kopp, J, Pinto, B

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