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Pulse-Vanishing Test for Interposers Wires in 2.5-D IC
by
Huang, Shi-Yu
,
Lee, Jeo-Yen
,
Tsai, Kun-Han
,
Cheng, Wu-Tung
Published in
IEEE transactions on computer-aided design of integrated circuits and systems
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At-speed BIST for interposer wires supporting on-the-spot diagnosis
by
Shi-Yu Huang
,
Jeo-Yen Lee
,
Kun-Han Tsai
,
Wu-Tung Cheng
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Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
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2.5-D Stacked Ic
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At-Speed Test
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Computer Science
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Delay Fault
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Engineering
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Engineering, Electrical & Electronic
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Interposer
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Science & Technology
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Wires
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Boundaries
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Bridging Fault
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Built-In Self-Test
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Circuit Faults
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Clocks
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Computer Aided Design
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Computer Science, Hardware & Architecture
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