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Long-term fluctuations associated with different standards
by
Valdes, J.
,
Porfiri, M.E.
,
Lobbe, E.E.
,
Kornblit, F.
,
Passarino de Marques, M.N.
,
Leiblich, J.A.
Published in
IEEE transactions on instrumentation and measurement
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Ieee Transactions On Instrumentation And Measurement
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Circuit Noise
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Engineering
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Engineering, Electrical & Electronic
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Exact Sciences And Technology
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Fluctuations
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Low-Frequency Noise
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Measurement Standards
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Measurement Uncertainty
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Metrology
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Metrology, Measurements And Laboratory Procedures
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Resistors
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