Search Results - Lepkowski, W

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  1. 1
    SOI MESFETs Fabricated Using Fully Depleted CMOS Technologies

    SOI MESFETs Fabricated Using Fully Depleted CMOS Technologies by Lepkowski, W., Ervin, J., Wilk, S.J., Thornton, T.J.

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  2. 2
    Ultra-low dropout linear regulator using an SOI MESFET

    Ultra-low dropout linear regulator using an SOI MESFET by Lepkowski, W, Wilk, S J, Bakkaloglu, B, Fechner, P S, Thornton, T J

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  3. 3
    Scaling SOI MESFETs to 150-nm CMOS Technologies

    Scaling SOI MESFETs to 150-nm CMOS Technologies by Lepkowski, W, Ghajar, M R, Wilk, S J, Summers, N, Thornton, T J, Fechner, P S

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  4. 4
    Backgate Modulation Technique for Higher Efficiency Envelope Tracking

    Backgate Modulation Technique for Higher Efficiency Envelope Tracking by Ghajar, M. R., Wilk, S. J., Lepkowski, W., Bakkaloglu, B., Thornton, T. J.

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  5. 5
    The Genius of Bell Labs' Bill Baker

    The Genius of Bell Labs' Bill Baker by Lepkowski, Wil

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  6. 6
    Enhanced voltage silicon NFET-MESFET cascode amplifiers integrated on a 45nm SOI CMOS technology for RFIC applications: Topic/category: 3D and power technologies

    Enhanced voltage silicon NFET-MESFET cascode amplifiers integrated on a 45nm SOI CMOS technology for RFIC applications: Topic/category: 3D and power technologies by Mehr, P. H., Lepkowski, W., Zhang, X., Moallemi, S., Kitchen, J., Thornton, T. J.

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  7. 7
    Universities and business fight over right to information

    Universities and business fight over right to information by Lepkowski, Wil

    Published in Nature (London)
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  8. 8
    An integrated MESFET voltage follower LDO for high power and PSR RF and analog applications

    An integrated MESFET voltage follower LDO for high power and PSR RF and analog applications by Lepkowski, W., Wilk, S. J., Ghajar, M. R., Bakkaloglu, B., Thornton, T. J.

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  9. 9
    Urgent talks follow damning report on US weapons labs

    Urgent talks follow damning report on US weapons labs by Lepkowski, Wil

    Published in Nature (London)
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  10. 10
    Weapon lab security may hit foreign visits

    Weapon lab security may hit foreign visits by Lepkowski, Wil

    Published in Nature (London)
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  11. 11
    Students win pay rise in Michigan strike

    Students win pay rise in Michigan strike by Lepkowski, Wil

    Published in Nature (London)
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  12. 12
    US panel says research can be assessed

    US panel says research can be assessed by Lepkowski, Wil

    Published in Nature (London)
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  13. 13
    High voltage SOI MESFETs at the 45nm technology node

    High voltage SOI MESFETs at the 45nm technology node by Lepkowski, W., Wilk, S. J., Ghajar, M. R., Thornton, T. J.

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  14. 14
    Characterization and modeling of enhanced voltage RF MESFETs on 45nm CMOS for RF applications

    Characterization and modeling of enhanced voltage RF MESFETs on 45nm CMOS for RF applications by Wilk, S. J., Ghajar, M. R., Lepkowski, W., Bakkaloglu, B., Thornton, T. J.

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  15. 15
    45 GHz silicon MESFETs on a 0.15 µm SOI CMOS process

    45 GHz silicon MESFETs on a 0.15 µm SOI CMOS process by Lepkowski, W., Wilk, S.J., Thornton, T.J.

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  16. 16
    Analog image processing circuit with 0.25µm CMOS compatible SOS MESFETs

    Analog image processing circuit with 0.25µm CMOS compatible SOS MESFETs by Kim, S, Lepkowski, W, Thornton, T J, Bakkaloglu, B

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  17. 17
    The Bhopal tragedy: its influence on process and community safety as practiced in the United States

    The Bhopal tragedy: its influence on process and community safety as practiced in the United States by Willey, Ronald J., Crowl, Daniel A., Lepkowski, Wil

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  18. 18
    Rifts in U.S. Patent System Spur National Research Council To Undertake "Most Ambitious Exam Ever"

    Rifts in U.S. Patent System Spur National Research Council To Undertake "Most Ambitious Exam Ever" by Lepkowski, Wil

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  19. 19
    SOI MESFETs for extreme environment buck regulators

    SOI MESFETs for extreme environment buck regulators by Lepkowski, W., Goryll, M., Wilk, S. J., Zhang, Y., Sochacki, J., Thornton, T. J.

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  20. 20
    EMI/ESD solutions for the CAN network

    EMI/ESD solutions for the CAN network by Lepkowski, J., Wolfe, B., Lepkowski, W.

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