2017 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman by Leray, Jean-Luc

Get full text

Comments by the Guest Editor by Ilgner, Christoph, Cao, Lei Raymond, Kouzes, Richard, Leray, Jean-Luc, Lyoussi, Abdallah, Dreyer, Jorn

Get full text

Comments by the Guest Editor by Ilgner, Christoph, Cao, Lei Raymond, Fiedler, Fine, Kouzes, Richard, Ledu, Patrick, Leray, Jean-Luc, Lyoussi, Abdallah, Petry, Winfried, Grazia Pia, Maria, Titov, Maxim, Wustenfeld, Jorn

Get full text

Comments by the Guest Editor by Ilgner, Christoph, Raymond Cao, Lei, Fiedler, Fine, Kouzes, Richard, LeDu, Patrick, Leray, Jean-Luc, Lyoussi, Abdallah, Petry, Winfried, Titov, Maxim, Wustenfeld, Jorn

Get full text

Prompt and Delayed Parasitic Currents Induced in Typical Insulators of Coaxial Cables by Large 14 MeV Sub-Nanosecond Neutrons Flux by Leray, Jean-Luc, Gazave, Julien, Sauvestre, Jean-Etienne, Bazzoli, Sébastien, Peyssonneaux, Olivier, Bourgade, Jean-Luc, Lubrano-Lavaderci, Frédéric

Get full text

Evidence for a Radiation Induced Electromotive Force (RIEMF) in Dielectrics Exposed to Very High 14 MeV Neutron Flux by Means of Neutron Induced Recoils by Leray, J.-L., Bazzoli, S., Sauvestre, J.-E., Glebov, V.Yu

Get full text

RADECS 2007 Conference Overview by Flament, Olivier, Baggio, Jacques, Ferlet-Cavrois, Vronique, Leray, Jean-Luc

Get full text

Conference Summary by Pinel, Joseph, Contant, Jean-Michel, Boudenot, Jean-Claud, Barbottin, Gerard, Luc Leray, Jean-Luc

Get full text

Total dose effects on a fully-depleted SOI NMOSFET and its lateral parasitic transistor by Ferlet-Cavrois, V., Musseau, O., Leray, J.-L., Pelloie, J.-L., Raynaud, C.

Get full text

Impact of technology scaling in SOI back-channel total dose tolerance. A 2-D numerical study using self-consistent oxide code by Leray, J.-L., Paillet, P., Ferlet-Cavrois, V., Tavernier, C., Belhaddad, K., Penzin, O.

Get full text

High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic Devices by Gaillardin, M., Martinez, M., Girard, S., Goiffon, V., Paillet, P., Leray, J. L., Magnan, P., Ouerdane, Y., Boukenter, A., Marcandella, C., Duhamel, O., Raine, M., Richard, N., Andrieu, F., Barraud, S., Faynot, O.

Get full text

Buried oxides: where we have been and where we are going by Leray, Jean-Luc

Get full text

Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose Environments by Gaillardin, M., Girard, S., Paillet, P., Leray, J. L., Goiffon, V., Magnan, P., Marcandella, C., Martinez, M., Raine, M., Duhamel, O., Richard, N., Andrieu, F., Barraud, S., Faynot, O.

Get full text

Activation Energies of Oxide Charge Recovery in SOS or SOI Structures after an Ionizing Pulse by Leray, Jean-Luc

Get full text

Trapping-detrapping properties of irradiated ultra-thin SIMOX buried oxides by Paillet, P., Autran, J.-L., Leray, J.-L., Aspar, B., Auberton-Herve, A.J.

Get full text

Prompt and delayed parasitic currents induced in typical insulators of coaxial cables by large 14 MeV sub-nanosecond neutrons flux by Leray, Jean-Luc, Gazave, Julien, Sauvestre, Jean-Etienne, Bazzoli, Sebastien, Peyssonneaux, Olivier, Bourgade, Jean-Luc, Lubrano-Lavaderci, Frederic

Request full text

Post-irradiation effects in a rad-hard technology by Chabrerie, C., Musseau, O., Flament, O., Leray, J.-L., Boudenot, J.-C., Shipman, B., Callewaert, H.

Get full text

RADECS 2007 overview

Request full text

Radiation effects in future electronics from device to systems - Roundtable report by Flament, O., Brichard, B., Chugg, A., Dyer, C., Edwards, R., Ibe, E., Lacoe, R., Paccagnella, A., Holmes-Siedle, A., Leray, J.-L.

Request full text

Severe morbidity according to sex in the era of combined antiretroviral therapy: the ANRS CO3 Aquitaine Cohort by Hessamfar, Mojgan, Colin, Céline, Bruyand, Mathias, Decoin, Madeleine, Bonnet, Fabrice, Mercié, Patrick, Neau, Didier, Cazanave, Charles, Pellegrin, Jean-Luc, Dabis, François, Morlat, Philippe, Chêne, Geneviève

Get full text