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Search Results - Li, R.F.Y.
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RTD Response Time Estimation in the Presence of Temperature Variations and Its Application to Semiconductor Manufacturing
by
Woei Wan Tan
,
Li, R.F.Y.
,
Ai Poh Loh
,
Weng Khuen Ho
Published in
IEEE transactions on instrumentation and measurement
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An in-situ temperature measurement system for DUV lithography
by
Woei Wan Tan
,
Li, R.F.Y.
Published in
IEEE transactions on instrumentation and measurement
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P14.11 Infection Control for Norovirus Gastroenteritis Outbreak in Acute Open-Designed Paediatric Ward
by
Leung, T.F.
,
Cheng, F.W.T.
,
Lai, R.W.M.
,
Chan, P.K.S.
,
Chan, R.F.Y.
,
Li, C.K.
,
Ng, P.C.
Published in
The Journal of hospital infection
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Ieee Transactions On Instrumentation And Measurement
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The Journal Of Hospital Infection
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Algorithms
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Engineering
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Engineering, Electrical & Electronic
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In-Situ Temperature Measurement
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Instruments & Instrumentation
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Measurement Accuracy
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Out-Of-Contact Fault
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Post-Exposure Bake
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Science & Technology
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Semiconductor Device Manufacture
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Sensors
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