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Built-In Bias Generation in Anti-Ferroelectric Stacks: Methods and Device Applications
by
Pesic, Milan
,
Larcher, Luca
,
Mikolajick, Thomas
,
Li, Taide
,
Di Lecce, Valerio
,
Hoffmann, Michael
,
Materano, Monica
,
Richter, Claudia
,
Max, Benjamin
,
Slesazeck, Stefan
,
Schroeder, Uwe
Published in
IEEE journal of the Electron Devices Society
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Ieee Journal Of The Electron Devices Society
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Aluminum Oxide
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Anti-Ferroelectric
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Antiferroelectricity
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Bias
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Capacitors
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Cmos
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Computer Memory
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Construction
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Dipoles
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Dram
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Durability
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Dynamic Random Access Memory
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Electrodes
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Ferroelectric Materials
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Hafnium Oxide
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Iron
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