Search Results - Liebig, J.P.

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  1. 1
    A flexible method for the preparation of thin film samples for in situ TEM characterization combining shadow-FIB milling and electron-beam-assisted etching

    A flexible method for the preparation of thin film samples for in situ TEM characterization combining shadow-FIB milling and electron-beam-assisted etching by Liebig, J.P., Göken, M., Richter, G., Mačković, M., Przybilla, T., Spiecker, E., Pierron, O.N., Merle, B.

    Published in Ultramicroscopy
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  2. 2
    Influence of grain boundaries on the deformation resistance: insights from an investigation of deformation kinetics and microstructure of copper after predeformation by ECAP

    Influence of grain boundaries on the deformation resistance: insights from an investigation of deformation kinetics and microstructure of copper after predeformation by ECAP by Bach, J., Liebig, J.P., Höppel, H.W., Blum, W.

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  3. 3
    Properties of 4 He and 6 Li with improved chiral EFT interactions

    Properties of 4 He and 6 Li with improved chiral EFT interactions by Maris, P., Binder, S., Calci, A., Epelbaum, E., Furnstahl, R.J., Golak, J., Hebeler, K., Kamada, H., Krebs, H., Langhammer, J., Liebig, S., Meißner, U.-G., Minossi, D., Nogga, A., Potter, H., Roth, R., Skibiński, R., Topolnicki, K., Vary, J.P., Witala, H.

    Published in EPJ Web of conferences
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  4. 4
    Properties of 4He and 6Li with improved chiral EFT interactions

    Properties of 4He and 6Li with improved chiral EFT interactions by Maris, P, Binder, S, Calci, A, Epelbaum, E, Furnstahl, R J, Golak, J, Hebeler, K, Kamada, H, Krebs, H, Langhammer, J, Liebig, S, U-G Meißner, Minossi, D, Nogga, A, Potter, H, Roth, R, Skibiński, R, Topolnicki, K, Vary, J P, Witala, H

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