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Search Results - Liew Tat Mun, S. C.
Search Results - Liew Tat Mun, S. C.
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Modeling of avalanche multiplication and excess noise factor in In0.52Al0.48As avalanche photodiodes using a simple Monte Carlo model
by
Mun, S. C. Liew Tat
,
Tan, C. H.
,
Goh, Y. L.
,
Marshall, A. R. J.
,
David, J. P. R.
Published in
Journal of applied physics
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Modeling of avalanche multiplication and excess noise factor in In 0.52 Al 0.48 As avalanche photodiodes using a simple Monte Carlo model
by
Mun, S. C. Liew Tat
,
Tan, C. H.
,
Goh, Y. L.
,
Marshall, A. R. J.
,
David, J. P. R.
Published in
Journal of applied physics
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A Theoretical Comparison of the Breakdown Behavior of [Formula Omitted] and InP Near-Infrared Single-Photon Avalanche Photodiodes
by
Liew Tat Mun, S. C.
,
Tan, C H
,
Dimler, S J
,
Tan, L J J
,
Ng, J S
,
Goh, Y L
,
David, J P R
Published in
IEEE journal of quantum electronics
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Design considerations for In0.52Al0.48As based avalanche photodiodes
by
Liew Tat Mun, S.C.
,
Tan, C.H.
,
Marshall, A.R.J.
,
Goh, Y.L.
,
Tan, L. J. J.
,
David, J.P.R.
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Journal Of Applied Physics
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Ieee Journal Of Quantum Electronics
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Subjects
Avalanche Photodiodes
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Bias
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Charge Carrier Processes
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Excess Noise Factor
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Impact Ionization
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In 0.52 Al 0.48 As
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Ionization
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Monte Carlo Methods
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Monte Carlo Modeling
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Noise Figure
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Noise Reduction
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Physical Sciences
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Physics
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Physics, Applied
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Science & Technology
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Semiconductor Device Noise
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Semiconductor Diodes
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Signal To Noise Ratio
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Sliding Mode Control
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Aip Digital Archive
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American Institute Of Physics(アメリカ物理学協会)
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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Ieee Xplore (Online Service)
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Ieee Xplore All Journals
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