Search Results - Lim, Vanissa Sei Wei

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  1. 1
    Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy

    Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy by Eng, Chee-Wee, Lau, Wai-Shing, Jiang, Yao-Yao, Vigar, David, Tee, Kheng-Chok, Chan, Lap, Lim, Vanissa Sei-Wei, Trigg, Alastair

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  2. 2
    Study of oxide quality for scanning capacitance microscope measurements

    Study of oxide quality for scanning capacitance microscope measurements by Lim, vanissa Sei Wei, Jiang, Yaoyao, Trigg, Alastair

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  3. 3
    Characterization of Hafnium Oxide Thin Films Prepared By MOCVD

    Characterization of Hafnium Oxide Thin Films Prepared By MOCVD by Choy, Siew Fong, Lim, Vanissa Sei Wei, Gopalakrishan, R, Trigg, Alastair, Bera, Lakshmi Kanta, Matthew, Shajan, Balasubramanian, N, Joo, Moon-Sig, Cho, Byung-Jin, Yeo, Chia Ching

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