Search Results - Lin, Shuw-Guann
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Phase noise and transient measurement methods for V-band applications
Conference Proceeding -
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Bit error rate measurement system for RF integrated circuits
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CIC - Cultivating IC Design Skills in Taiwan [MTT World]
Published in IEEE microwave magazineGet full text
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On-wafer noise figure measurements of millimeter-wave LNA and mixer
Conference Proceeding -
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On-wafer mm-wave V-band semi-automatic power measurement system
Conference Proceeding -
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CIC - Cultivating IC Design Skills in Taiwan MTT World
Published in IEEE microwave magazineGet full text
Magazinearticle