Search Results - Lintz, John. P.

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Single event effects hardening and characterization of honeywell's pass 3 RHPPC processor integrated circuit

    Single event effects hardening and characterization of honeywell's pass 3 RHPPC processor integrated circuit by Lintz, John. P., Hoffmann, Lee. F., Smith, Matthew. J., van Cleave, Russell. T., Cizmarik, Ryan. R.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  2. 2
    Current single event effects results for candidate spacecraft electronics for NASA

    Current single event effects results for candidate spacecraft electronics for NASA by O'Bryan, M.V., Seidleck, C.M., Carts, M.A., Howard, J.W., Kim, H.S., Forney, J.D., Label, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Buchner, S.P., Oldham, T.R., Sutton, J., Irwin, T.L., Rodriguez, E., McMorrow, D., Kniffin, S.D., Ladbury, R.L., Walter, M., Palor, C., Marshall, P.W., McCall, M., Meyer, S., Lintz, J., Rodgers, J., Mohammed, S., Rapchun, D.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: