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    TEM study of defect structure of GaN epitaxial films grown on GaN/Al sub(2)O sub(3) substrates with buried column pattern

    TEM study of defect structure of GaN epitaxial films grown on GaN/Al sub(2)O sub(3) substrates with buried column pattern by Mynbaevaa, M G, Kremlevaa, A V, Kirilenkoa, DA, Sitnikovaa, A A, Pechnikovb, AI, Mynbaeva, K D, Nikolaeva, VI, Bougrovb, V E, Lipsanenb, H, Romanova, A E

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