Search Results - Lohonka, R

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  1. 1
    Ultrasonic C-Scan and shearography NDI techniques evaluation of impact defects identification

    Ultrasonic C-Scan and shearography NDI techniques evaluation of impact defects identification by Růžek, Roman, Lohonka, Radek, Jironč, Josef

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  2. 2
    Modelling of the plastic behaviour of III–V compound semiconductors during compressive tests

    Modelling of the plastic behaviour of III–V compound semiconductors during compressive tests by Lohonka, R., Vanderschaeve, G., Kratochvı́l, J.

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  3. 3
    Modelling of plastic behaviour of compound semiconductors; from simple glide to multiglide

    Modelling of plastic behaviour of compound semiconductors; from simple glide to multiglide by Lohonka, R, Vanderschaeve, G, Kratochvíl, J

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