Search Results - Lohrke, Heiko

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  1. 1
    Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction

    Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction by Gref, Orman, Teodoreanu, Ana-Maria, Leihkauf, Rainer, Lohrke, Heiko, Kittler, Martin, Amkreutz, Daniel, Boit, Christian, Friedrich, Felice

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  2. 2
    Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout

    Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout by Krachenfels, Thilo, Lohrke, Heiko, Seifert, Jean-Pierre, Dietz, Enrico, Frohmann, Sven, Hübers, Heinz-Wilhelm

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  3. 3
    PUFMon: Security monitoring of FPGAs using physically unclonable functions

    PUFMon: Security monitoring of FPGAs using physically unclonable functions by Tajik, Shahin, Fietkau, Julian, Lohrke, Heiko, Seifert, Jean-Pierre, Boit, Christian

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  4. 4
    Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout

    Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout by Krachenfels, Thilo, Lohrke, Heiko, Seifert, Jean-Pierre, Dietz, Enrico, Frohmann, Sven, Heinz-Wilhelm Hübers

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  5. 5
    Visible light techniques in the FinFET era: Challenges, threats and opportunities

    Visible light techniques in the FinFET era: Challenges, threats and opportunities by Lohrke, Heiko, Zollner, Hannes, Scholz, Philipp, Tajik, Shahin, Boit, Christian, Seifert, Jean-Pierre

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