Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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High frequency drain current noise modeling in MOSFETs under sub-threshold condition by Chan, L.H.K., Yeo, K.S., Chew, K.W.J., Ong, S.N., Loo, X.S., Boon, C.C., Do, M.A.

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A new unified model for channel thermal noise of deep sub-micron RFCMOS by Ong, S.N., Chew, K.W.J., Yeo, K.S., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Do, M.A., Boon, C.C.

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A novel de-embedding technique for On-Wafer characterization of RF CMOS by Loo, X.S., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Ong, S.N., Do, M.A., Boon, C.C.

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Parental, Perinatal, and Childhood Risk Factors for Development of Irritable Bowel Syndrome: A Systematic Review by Low, En X S, Mandhari, Maimouna N K Al, Herndon, Charles C, Loo, Evelyn X L, Tham, Elizabeth H, Siah, Kewin T H

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Sirolimus and tacrolimus in clinical cardiac transplantation by Pham, S.M, Qi, X.S, Mallon, S.M, Kaplon, R.J, Bauerlein, E.J, Katariya, K, Sequeira, R.F, Bolooki, H, Rosenkranz, E, Loo, A.F, Lee, P.C, Jimenez, J, Salerno, T.A

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