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P‐16.8: The Vth shift of ASG after high temperature operating
by
Lou, Tenggang
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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21.3: Invited Paper: Avoiding Mini‐LED circuit scratch in process
by
Lou, Tenggang
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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P‐5.10: 18.8 Inch 8K5K 3D Printing Panel With IGZO TFT
by
Lou, Tenggang
,
Xu, Wenqin
,
Jiang, Ruoyu
,
Wang, Chen
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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P‐17.1: ASG with wide operating temperature
by
Lou, Tenggang
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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60‐4: A MicroLED Device with 0mm Border
by
Lou, Tenggang
,
Yao, Lu
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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P‐21: A Low‐Power Transflective TFT‐LCD Based On IGZO TFT
by
Lou, Tenggang
,
Wang, Lei
,
Kong, Xiangjian
,
Liu, Jine
,
Qin, Feng
Published in
SID International Symposium Digest of technical papers
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Sid International Symposium Digest Of Technical Papers
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Subjects
A-Si Gate
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Asg Malfunction
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Backlights
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Circuit Reliability
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Circuits
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Crosstalk
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Gate In Panel
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High Temperature
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Igzo
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Indium Gallium Zinc Oxide
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Low Temperature
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Operating Temperature
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Ra
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Reliability Analysis
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3D Printer
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3D Printing
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Borderless
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Wiley-Blackwell Journals
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Wiley-Blackwell Read & Publish Collection
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