Search Results - Ludacka, U.

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  1. 1
    Moiré fringes in conductive atomic force microscopy

    Moiré fringes in conductive atomic force microscopy by Richarz, L., He, J., Ludacka, U., Bourret, E., Yan, Z., van Helvoort, A. T. J., Meier, D.

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  2. 2
    In situ control of graphene ripples and strain in the electron microscope

    In situ control of graphene ripples and strain in the electron microscope by Ludacka, U., Monazam, M. R. A., Rentenberger, C., Friedrich, M., Stefanelli, U., Meyer, J. C., Kotakoski, J.

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  3. 3
    Ferroelectric domain walls for environmental sensors

    Ferroelectric domain walls for environmental sensors by Richarz, L, Skogvoll, I C, Tokle, E Y, Hunnestad, K A, Ludacka, U, J He, Bourret, E, Yan, Z, A T J van Helvoort, Schultheiß, J, Selbach, S M, Meier, D

    Published in arXiv.org
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  4. 4
    Moiré Fringes in Conductive Atomic Force Microscopy

    Moiré Fringes in Conductive Atomic Force Microscopy by Richarz, L, J He, Ludacka, U, Bourret, E, Yan, Z, A T J van Helvoort, Meier, D

    Published in arXiv.org
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