Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001) by Özcan, A.S., Ludwig, Jr, K.F., Lavoie, C., Basu, S.N., Coia, C., Cabral, Jr, C., Rodbell, K.P., Harper, J.M.E.

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Noncritical behavior of density fluctuations in supercooled water by YONGLIN XIE, LUDWIG, K. F, MORALES, G, HARE, D. E, SORENSEN, C. M

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X-ray studies of concentrated aqueous solutions by LUDWIG, K. F. JR, WARBURTON, W. K, FONTAINE, A

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Increased transition temperature in [ital in] [ital situ] coevaporated YBa[sub 2]Cu[sub 3]O[sub 7[minus][delta]] thin films by low temperature post-annealing by Berkowitz, S.J., De Obaldia, E., Ludwig, K.F. Jr, Skocpol, W.J., Mankiewich, P.M., Ono, R.H., Beall, J.A., Vale, L.R., Rudman, D.A., O'Malley, M.L., Drabeck, L.M., Polakos, P.A.

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Development of Fluctuations Into Domains During Ordering in Fe sub 3 Al by Park, B, Stephenson, G B, Allen, S M, Ludwig, K F

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Absorption effects in the determination of anomalous scattering factors using X-ray refraction through a prism by WARBURTON, W. K, LUDWIG, K. F. JR

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Determination of anomalous scattering factors in GaAs using x-ray refraction through a prism by FONTAINE, A, WARBURTON, W. K, LUDWIG, K. F. JR

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Surface evolution of lanthanum strontium cobalt ferrite thin films at low temperatures by Newby, D., Kuyyalil, J., Laverock, J., Ludwig, K.F., Yu, Y., Davis, J., Gopalan, S., Pal, U.B., Basu, S., Smith, K.E.

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Formation of a crystalline metal-rich silicide in thin film titanium/silicon reactions by Clevenger, L.A, Cabral, C, Roy, R.A, Lavoie, C, Jordan-Sweet, J, Brauer, S, Morales, G, Ludwig, K.F, Stephenson, G.B

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