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Search Results - Lugani, Gurpreet S.
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Direct Emissions Reduction in Plasma Dry Etching Using Alternate Chemistries: Opportunities, Challenges, and Need for Collaboration
by
Lugani, Gurpreet S.
,
Skaggs, Robert
,
Morris, Bryan
,
Tolman, Tyler
,
Tervo, Douglas
,
Uhlenbrock, Stefan
,
Hacker, Jon
,
Seng Tan, Chye
,
Nehlsen, James P.
,
Ridgeway, Robert G.
,
Wong Broadway, Lois
,
Rudy, Francis P.
Published in
IEEE transactions on semiconductor manufacturing
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Ieee Transactions On Semiconductor Manufacturing
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Cf
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Cleaning
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Cof
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Dry Etch
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Dry Etching
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