Search Results - Lugo Muñoz, Denise C.

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  1. 1
    A new integration-based procedure to separately extract series resistance and mobility degradation in MOSFETs

    A new integration-based procedure to separately extract series resistance and mobility degradation in MOSFETs by Muci, Juan, Muñoz, Denise C Lugo, Rey, Álvaro D Latorre, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J, Ho, Ching-Sung, Liou, Juin J

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  2. 2
    Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction

    Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction by Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Rey, Álvaro D., Ho, Ching-Sung, Liou, Juin J.

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  3. 3
    Extraction of MOSFET Model Parameters from the Measured Source-to-drain Resistance

    Extraction of MOSFET Model Parameters from the Measured Source-to-drain Resistance by Garcia-Sanchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Reya, Alvaro A., Ortiz-Conde, Adelmo, Ho, Ching S., Liou, Juin J.

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  4. 4
    Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting

    Parameter Extraction in Quadratic Exponential Junction Model with Series Resistance using Global Lateral Fitting by Lugo-Muñoz, Denise, De Souza, Michelly, Pavanello, Marcelo A., Flandre, Denis, Muci, Juan, Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J.

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