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Hierarchical test pattern generation: a cost model and implementation
by
Min, H.B.
,
Luh, H.-t.A.
,
Rogers, W.A.
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IEEE transactions on computer-aided design of integrated circuits and systems
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FANHAT: fanout oriented hierarchical automatic test generation system
by
Min, H.B.
,
Rogers, W.A.
,
Luh, H.-T.A.
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Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
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Automatic Test Pattern Generation
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