Secondary electron emission chamber for measuring the intensity of slowly extracted beams by Asanov, V. N., Grishin, V. N., Ivanova, N. S., Kopyrin, A. A., Koshelev, A. V., Larionov, A. V., Luk’yantsev, A. F., Makonin, S. V., Matyushin, A. A., Milyutkin, V. P., Seleznev, V. S., Sleptsov, M. A., Sotnikov, A. Yu, Sytin, A. N.

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Intensive beam monitors of the FODS spectrometer by Volkov, A. A., Efremov, V. P., Ivanova, N. S., Kalinin, A. Yu, Korablev, A. V., Koshelev, A. V., Krinitsyn, A. N., Kryshkin, V. I., Kulagin, N. V., Luk’yantsev, A. F., Makonin, S. V., Matyushin, A. A., Milyutkin, V. P., Mishagin, Yu. A., Seleznev, V. S., Skvortsov, V. V., Sotnikov, A. Yu, Talov, V. V., Turchanovich, L. K.

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The 780/E 32-bit specialised processor-emulator by Voevodin, V.P., Govorun, V.N., Davidenko, A.M., Ekimov, An.V., Ivanova, N.S., Kovaltsov, V.I., Kozyaev, Yu.M., Lukyantsev, A.F., Matveev, M.Yu, Senko, V.A., Sytin, A.N., Tishin, G.V.

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New books by Detinenko, N. E., Zakamskii, L. L., Ivanov, A. A., Kuz'menko, V. G., Luk'yantsev, A. F., Nechaev, Yu. S., Solov'ev, V. E., Borodatyi, V. I., Vostroknutov, N. N., Kapiev, R. ., Kolomiitsev, L. A., Kashlakov, V. M., Abubakirov, B. A., Avdeeva, A. A., Gurevich, M. L., Nasonov, V. S., Gorn, L. S., Khazanov, B. I., Grigorovich, V. K., Godzikovskii, V. A.

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The UNK control system by Alferov, V.N., Brook, V.L., Dunaitsev, A.F., Goloborodko, S.G., Kazakov, P.N., Komarov, V.V., Lukyantsev, A.F., Mikheev, M.S., Trofimov, N.N., Sakharov, V.P., Scherbakov, E.D., Voevodin, V.P., Zelepoukin, S.A., Kuiper, B.

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