Search Results - Lundquist, T.R.

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  1. 1
    Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light

    Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light by Rutkauskas, M., Farrell, C., Dorrer, C., Marshall, K.L., Crawford, T., Lundquist, T.R., Vedagarbha, P., Erington, K., Bodoh, D., Reid, D.T.

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  2. 2
    Limitations to photon-emission microscopy when applied to “hot” devices

    Limitations to photon-emission microscopy when applied to “hot” devices by Deslandes, Hervé, Lundquist, T.R.

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  3. 3
    Impact of back side circuit edit on active device performance in bulk silicon ICs

    Impact of back side circuit edit on active device performance in bulk silicon ICs by Kerst, U., Schlangen, R., Kabakow, A., Le Roy, E., Lundquist, T.R., Pauthner, S.

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  4. 4
    Reducing focused ion beam charging effects on insulators by heating: A practical method for TEM specimen preparation of nonconductors

    Reducing focused ion beam charging effects on insulators by heating: A practical method for TEM specimen preparation of nonconductors by Lundquist, T.R., Alani, R., Swann, P.R.

    Published in Ultramicroscopy
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  5. 5
    Secondary emission mass spectrometer

    Secondary emission mass spectrometer by Kelner, L., Lundquist, T.R.

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  6. 6
    FIB etching of Cu with minimal impact on neighboring circuitry, including dielectric

    FIB etching of Cu with minimal impact on neighboring circuitry, including dielectric by Ng, K., Motegi, S., Jain, R.K., Lundquist, T.R., Makarov, V.V.

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  7. 7
    Quantitative hydrogen depth-profiling using SIMS

    Quantitative hydrogen depth-profiling using SIMS by Lundquist, T.R., Burgner, R.P., Swann, P.R., Tsong, I.S.T.

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  8. 8
    Secondary emission mass spectrometer, application and evaluation

    Secondary emission mass spectrometer, application and evaluation by Kelner, L., Markey, S.P., Fales, H.M., Lundquist, T.R.

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