Search Results - Lyaschenko, S.A.

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    In situ magneto-optical ellipsometry data analysis for films growth control

    In situ magneto-optical ellipsometry data analysis for films growth control by Maximova, O.A., Kosyrev, N.N., Varnakov, S.N., Lyaschenko, S.A., Yakovlev, I.A., Tarasov, I.A., Shevtsov, D.V., Maximova, O.M., Ovchinnikov, S.G.

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  2. 2
    Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method

    Determination of structural parameters of the Fe-Si-system by spectral ellipsometry method by Lyaschenko, S.A., Varnakov, S.N., Ovchinnikov, S.G., Berezitskaya, E.P., Alexandrova, G.A., Vaituzin, O.P.

    Published in Physics procedia
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