Search Results - MOCCIO, S. V

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  1. 1
    Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation

    Quantification of scanning capacitance microscopy imaging of the pn junction through electrical simulation by O’Malley, M. L., Timp, G. L., Moccio, S. V., Garno, J. P., Kleiman, R. N.

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  2. 2
    Understanding the limits of ultrathin SiO2 and Si-O-N gate dielectrics for sub-50 nm CMOS

    Understanding the limits of ultrathin SiO2 and Si-O-N gate dielectrics for sub-50 nm CMOS by GREEN, M. L, SORSCH, T. W, TIMP, G. L, MULLER, D. A, WEIR, B. E, SILVERMAN, P. J, MOCCIO, S. V, KIM, Y. O

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  3. 3
    Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips

    Electrical simulation of scanning capacitance microscopy imaging of the pn junction with semiconductor probe tips by O’Malley, M. L., Timp, G. L., Timp, W., Moccio, S. V., Garno, J. P., Kleiman, R. N.

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  4. 4
    Understanding the limits of ultrathin SiO sub(2) and Si-O-N gate dielectrics for sub-50 nm CMOS

    Understanding the limits of ultrathin SiO sub(2) and Si-O-N gate dielectrics for sub-50 nm CMOS by Green, M L, Sorsch, T W, Timp, G L, Muller, D A, Weir, B E, Silverman, P J, Moccio, S V, Kim, Y O

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  5. 5
    A-010 Systemwide Implementation of High Sensitivity Troponin T in a Multi-center Hospital Set Up with Instrument Variability: The Baystate Health Experience

    A-010 Systemwide Implementation of High Sensitivity Troponin T in a Multi-center Hospital Set Up with Instrument Variability: The Baystate Health Experience by Pandiri, M, Kotorobay, D, Ibrahim, S, Rogers, J, Paz, A, Moccio, R, Ouimet, G, Fleischmann, D, Paadam, J, Baevsky, R, Lotfi, A, Quarles, R, Gemme, S, Johari, V, Barbhuiya, M A

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  6. 6
    Low leakage, ultra-thin gate oxides for extremely high performance sub-100 nm nMOSFETs

    Low leakage, ultra-thin gate oxides for extremely high performance sub-100 nm nMOSFETs by Timp, G., Agarwal, A., Baumann, F.H., Boone, T., Buonanno, M., Cirelli, R., Donnelly, V., Foad, M., Grant, D., Green, M., Gossmann, H., Hillenius, S., Jackson, J., Jacobson, D., Kleiman, R., Komblit, A., Klemens, F., Lee, J.T.-C., Mansfield, W., Moccio, S., Murrell, A., O'Malley, M., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tai, W.W., Tennant, D., Vuong, H., Weir, B.

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