A 300-mm Silicon Photonics Platform for Large-Scale Device Integration by Horikawa, Tsuyoshi, Shimura, Daisuke, Okayama, Hideaki, Seok-Hwan Jeong, Takahashi, Hiroyuki, Ushida, Jun, Sobu, Yohei, Shiina, Akemi, Tokushima, Masatoshi, Kinoshita, Keizo, Mogami, Tohru

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Low-loss silicon wire waveguides for optical integrated circuits by Horikawa, Tsuyoshi, Shimura, Daisuke, Mogami, Tohru

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Device structure and fabrication process for silicon spin qubit realizing process-variation-robust SWAP gate operation by Asai, Hidehiro, Iizuka, Shota, Mogami, Tohru, Hattori, Junichi, Fukuda, Koichi, Ikegami, Tsutomu, Kato, Kimihiko, Oka, Hiroshi, Mori, Takahiro

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Comparison of drug susceptibility between Escherichia coli detected in stool cultures of patients undergoing transrectal prostate needle biopsy and Escherichia coli in hospital-wid... by Etani, Toshiki, Mogami, Tohru, Yamaguchi, Sachiyo, Takeda, Tomoki, Sugino, Teruaki, Shimizu, Nobuhiko, Noda, Yusuke, Nagai, Takashi, Nozaki, Satoshi, Iida, Keitaro, Naiki, Taku, Ando, Ryosuke, Kawai, Noriyasu, Yasui, Takahiro

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Brown adipocytes and β3-stimulant-induced brown-like adipocytes contribute to the prevention of renal crystal formation by Sugino, Teruaki, Okada, Atsushi, Taguchi, Kazumi, Unno, Rei, Hamamoto, Shuzo, Ando, Ryosuke, Mogami, Tohru, Kohri, Kenjiro, Yamashita, Hitoshi, Yasui, Takahiro

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A case of secondary adrenocortical insufficiency due to isolated adrenocorticotropic hormone deficiency with empty sella syndrome after pembrolizumab treatment in a patient with me... by Nagai, Takashi, Mogami, Tohru, Takeda, Tomoki, Tomiyama, Nami, Yasui, Takahiro

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Direct Measurement of Correlation Between SRAM Noise Margin and Individual Cell Transistor Variability by Using Device Matrix Array by Hiramoto, T., Suzuki, M., Song, X., Shimizu, K., Saraya, T., Nishida, A., Tsunomura, T., Kamohara, S., Takeuchi, K., Mogami, T.

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The impacts of fabrication error in Si wire-waveguides on spectral variation of coupled resonator optical waveguides by Horikawa, Tsuyoshi, Shimura, Daisuke, Jeong, Seok-Hwan, Tokushima, Masatoshi, Kinoshita, Keizo, Mogami, Tohru

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1.2 Tbps/cm2 Enabling Silicon Photonics IC Technology Based on 40-nm Generation Platform by Mogami, Tohru, Ukita, Akio, Takemura, Koichi, Kurihara, Mitsuru, Yashiki, Kenichiro, Okamoto, Daisuke, Suzuki, Yasuyuki, Sobu, Yohei, Jeong, Seok-Hwan, Tanaka, Yu, Nakamura, Takahiro, Horikawa, Tsuyoshi, Kurata, Kazuhiko, Kinoshita, Keizo, Hagihara, Yasuhiko, Ushida, Jun, Tokushima, Masatoshi, Fujikata, Junichi, Takahashi, Shigeki, Shimizu, Takanori

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Study on the effects of the Si capping layer growth conditions on the leakage current of Ge photodetector by Okumura, Shigekazu, Kinoshita, Keizo, Fujikata, Junichi, Simoyama, Takasi, Ono, Hideki, Tanaka, Yu, Morito, Ken, Horikawa, Tsuyoshi, Mogami, Tohru

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Statistical Model of Line-Edge and Line-Width Roughness for Device Variability Analysis by Hiraiwa, A, Nishida, A, Mogami, T

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High-performance optical waveguide devices using 300mm Si photonics platform by Mogami, Tohru, Horikawa, Tsuyoshi, Kinoshita, Keizo, Sasaki, Hironori, Morito, Ken, Kurata, Kazuhiko

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Effect of channel dopant uniformity on MOSFET threshold voltage variability by Terada, Kazuo, Sanai, Kazuhiko, Tsuji, Katsuhiro, Tsunomura, Takaaki, Nishida, Akio, Mogami, Tohru

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Direct Observation of Fluctuations in the Number and Individual Electronic Properties of Interface Traps in Nanoscale Metal--Oxide--Semiconductor Field-Effect Transistors by Tsuchiya, Toshiaki, Mori, Yuki, Morimura, Yuta, Mogami, Tohru, Ohji, Yuzuru

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Inflammatory Myofibroblastic Tumor of the Urinary Bladder: A Case Report by Etani, Toshiki, Naiki, Taku, Nagai, Takashi, Iida, Keitaro, Ando, Ryosuke, Naiki-Ito, Aya, Kawai, Noriyasu, Tozawa, Keiichi, Mizuno, Kentaro, Okada, Atsushi, Mogami, Tohru, Yasui, Takahiro

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High-Temperature Properties of Drain Current Variability in Scaled Field-Effect Transistors Analyzed by Decomposition Method by Tsunomura, Takaaki, Kumar, Anil, Mizutani, Tomoko, Nishida, Akio, Takeuchi, Kiyoshi, Inaba, Satoshi, Kamohara, Shiro, Terada, Kazuo, Hiramoto, Toshiro, Mogami, Tohru

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Origin of Larger Drain Current Variability in N-Type Field-Effect Transistors Analyzed by Variability Decomposition Method by Tsunomura, Takaaki, Kumar, Anil, Mizutani, Tomoko, Nishida, Akio, Takeuchi, Kiyoshi, Inaba, Satoshi, Kamohara, Shiro, Terada, Kazuo, Hiramoto, Toshiro, Mogami, Tohru

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Three-Dimensional Dopant Characterization of Actual Metal--Oxide--Semiconductor Devices of 65 nm Node by Atom Probe Tomography by Inoue, Koji, Takamizawa, Hisashi, Shimizu, Yasuo, Yano, Fumiko, Toyama, Takeshi, Nishida, Akio, Mogami, Tohru, Kitamoto, Katsuyuki, Miyagi, Takahiro, Kato, Jun, Akahori, Seishi, Okada, Noriyuki, Kato, Mikio, Uchida, Hiroshi, Nagai, Yasuyoshi

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Effect of Channel Dopant Non-uniformity on Transconductance Variability by Terada, Kazuo, Takeda, Ryo, Tsuji, Katsuhiro, Tsunomura, Takaaki, Nishida, Akio, Mogami, Tohru

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Agile-X: A Structured-ASIC Created With a Mask-Less Lithography System Enabling Low-Cost and Agile Chip Fabrication by Kosuge, Atsutake, Sumi, Hirofumi, Shimamoto, Naonobu, Ochiai, Yukinori, Inoue, Yurie, Amano, Hideharu, Mogami, Tohru, Mita, Yoshio, Ikeda, Makoto, Kuroda, Tadahiro

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