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Lithography-patterning-fidelity-aware electron-optical system design optimization
by
Chen, Sheng-Yung
,
Ng, Hoi-Tou
,
Ma, Shiau-Yi
,
Chen, Hsing-Hong
,
Liu, Chun-Hung
,
Tsai, Kuen-Yu
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Journal of vacuum science and technology. B, Nanotechnology & microelectronics
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Journal Of Vacuum Science & Technology B, Nanotechnology And Microelectronics: Materials, Processing, Measurement, And Phenomena
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Journal Of Vacuum Science & Technology. B, Microelectronics And Nanometer Structures Processing, Measurement And Phenomena
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Journal Of Vacuum Science And Technology. B, Nanotechnology & Microelectronics
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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