Search Results - Madian, H A

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  1. 1
    Sucralose Influences the Productive Performance, Carcass Traits, Blood Components, and Gut Microflora Using 16S rRNA Sequencing of Growing APRI-Line Rabbits

    Sucralose Influences the Productive Performance, Carcass Traits, Blood Components, and Gut Microflora Using 16S rRNA Sequencing of Growing APRI-Line Rabbits by El-Tahan, Hatem M, Elmasry, Mohamad Elsayed, Madian, H A, Alhimaidi, Ahmad R, Kim, In Ho, Park, Jae Hong, El-Tahan, Hossam M

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  2. 2
    Memcapacitor based CMOS neural amplifier

    Memcapacitor based CMOS neural amplifier by Madian, A. H., Moustafa, S. H., El-Kolaly, H. E.

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  3. 3
    Regulatory functions of lecithin nanoparticles on post-thaw quality of buffalo bull semen: a morphological analysis of spermatozoa

    Regulatory functions of lecithin nanoparticles on post-thaw quality of buffalo bull semen: a morphological analysis of spermatozoa by Eliraqy, E. Z., Sakr, A. M., Hassan, M. A., Madian, H. A., AbdEl-Rafaa, L. A., Gharib, M. G., Abou-Seri, H. S., El-ganainy, Sh. M.M.

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  4. 4
    Energy-efficient wireless sensor network for nuclear radiation detection

    Energy-efficient wireless sensor network for nuclear radiation detection by Elrefaei, Jannat H., Kunber, H., Shaat, M.K., Madian, A.H., Saad, M.H.

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  5. 5
    Memristor based carry lookahead adder architectures

    Memristor based carry lookahead adder architectures by Shaltoot, A. H., Madian, A. H.

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  6. 6
    Voltage-controlled M-M relaxation oscillator

    Voltage-controlled M-M relaxation oscillator by Hezayyin, Haneen G., Ahmed, Gehad M., Fouda, M. E., Madian, A. H., Radwan, A. G.

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  7. 7
    Built-in-current-sensor for testing short and open faults in CMOS digital circuits

    Built-in-current-sensor for testing short and open faults in CMOS digital circuits by Ahmed, R F, Radwan, A G, Madian, A H, Soliman, A M

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  8. 8
    Built-In Current Sensor for testing Current Feedback Operational Amplifier

    Built-In Current Sensor for testing Current Feedback Operational Amplifier by Ahmed, R F, Madian, A H, Radwan, A G, Soliman, A M

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  9. 9
    Memristor-based modified recoded-multiplicand systolic serial-parallel multiplier

    Memristor-based modified recoded-multiplicand systolic serial-parallel multiplier by Shaltoot, A. H., Madian, A. H.

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  10. 10
    Resistorless memristor based oscillator

    Resistorless memristor based oscillator by ElSamman, A. H., Radwan, A. G., Madian, A. H.

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  11. 11
    Low voltage digitally programmable gain and bandwidth fully differential CMOS neural amplifier

    Low voltage digitally programmable gain and bandwidth fully differential CMOS neural amplifier by ElGuindy, M., Madian, A. H.

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  12. 12
    The modified single input Op-Amps memristor based oscillator

    The modified single input Op-Amps memristor based oscillator by ElSamman, A. H., Radwan, A. G., Madian, A. H.

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  13. 13
    Testing current mode two-input logic gates

    Testing current mode two-input logic gates by Amer, S. H., Emara, A. S., El-Din, R. Mohie, Fouad, M. M., Madian, A. H., Amer, H. H., Abdelhalim, M. B., Draz, H. H.

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  14. 14
    Catastrophic short and open fault detection in MOS current mode circuits: A case study

    Catastrophic short and open fault detection in MOS current mode circuits: A case study by Madian, A H, Amer, H H, Eldesouky, A O

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  15. 15
    MOS current mode logic realization of digital arithmetic circuits

    MOS current mode logic realization of digital arithmetic circuits by El-Hariry, Y M, Madian, A H

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  16. 16
    Memristor-based oscillator using Deboo integrator

    Memristor-based oscillator using Deboo integrator by ElSamman, A. H., Radwan, A. G., Madian, A. H.

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  17. 17
    Analog fault diagnosis and testing by inverse problem technique

    Analog fault diagnosis and testing by inverse problem technique by Ahmed, R. F., Radwan, A. G., Madian, A. H., Soliman, A. M.

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  18. 18
    N-stage pipelined Digital to Analog converter testing

    N-stage pipelined Digital to Analog converter testing by Hamed, S. M., Khalil, A. H., Abdelhalim, M. B., Amer, H. H., Madian, A. H.

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  19. 19
    Low cost test for catastrophic faults in CMOS operational transcondutor

    Low cost test for catastrophic faults in CMOS operational transcondutor by Fouad, M. M., Madian, A. H., Amer, Hassanein H., AbdelHalim, M. B.

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  20. 20
    DC testing of switched capacitor based delta sigma converters

    DC testing of switched capacitor based delta sigma converters by Ahmed, O. S., Abdelhalim, M. B., Madian, A. H., Amer, H. H.

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