Search Results - Madugula, Sumalatha

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    Exploring High-Temperature Reliability of 4H-SiC MOSFETs : A Comparative Study of High-K Gate Dielectric Materials

    Exploring High-Temperature Reliability of 4H-SiC MOSFETs : A Comparative Study of High-K Gate Dielectric Materials by M. V. Ganeswara Rao, N. Ramanjaneyulu, Sumalatha Madugula, N. P. Dharani, K. Rajesh Babu, Kallepelli Sagar

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    RETRACTED ARTICLE: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials

    RETRACTED ARTICLE: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials by Ganeswara Rao, M. V., Ramanjaneyulu, N., Madugula, Sumalatha, Dharani, N. P., Rajesh Babu, K., Sagar, Kallepelli

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    Retraction Note: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials

    Retraction Note: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials by Ganeswara Rao, M. V., Ramanjaneyulu, N., Madugula, Sumalatha, Dharani, N. P., Rajesh Babu, K., Sagar, Kallepelli

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