Search Results - Magdeliza, G.

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    A new paradigm of using TEM in yield enhancement failure analysis for sub-micron integrated circuit devices

    A new paradigm of using TEM in yield enhancement failure analysis for sub-micron integrated circuit devices by Oh, C.K., Song, Z.G., Neo, S.P., Ang, G.B., Magdeliza, G., Redkar, S.

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    Conference Proceeding
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