Defect inspection of photovoltaic solar modules using aerial electroluminescence (EL): A review by Mahdavipour, Zeinab

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Detection of microcracks and dark spots in monocrystalline PERC cells using photoluminescene imaging and YOLO-based CNN with spatial pyramid pooling by Binomairah, Amran, Abdullah, Azizi, Khoo, Bee Ee, Mahdavipour, Zeinab, Teo, Teow Wee, Mohd Noor, Nor Shahirah, Abdullah, Mohd Zaid

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Recent advancements in micro-crack inspection of crystalline silicon wafers and solar cells by Teo, Teow Wee, Mahdavipour, Zeinab, Abdullah, Mohd Zaid

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Micro-crack Detection of Polycrystalline Silicon Solar Wafer by Mahdavipour, Zeinab, Abdullah, Mohd Zaid

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Roadmap on Industrial Imaging Techniques by Da Silva, Marco Jose Jose, Lee, Jung-Ryul, Yoo, Hongki, Chia, Chen Ciang, Kim, Young-Jin, KIM, Daehee, Teo, Teow Wee, Mahdavipour, Zeinab, Abdullah, Azizi, Khoo, Bee Ee, Abdullah, Mohd Z, Iakovidis, Dimitris K., Vartholomeos, Panagiotis, Yacoot, Andrew, Cai, Tao, Kim, Mirae, Kim, Kyung Chun, Ye, Jiamin, Liang, Xiao, Cao, Lidan, Wang, Xingwei, Huang, Jianqing, Cai, Weiwei, Wu, Yingchun, Tan, Chao, Bhattacharya, Sayantan, Vlachos, Pavlos, Cierpka, Christian, Rossi, Massimiliano

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Design of an Imaging System for Characterizing Microcracks in Crystalline Silicon Solar Cells Using Light Transflection by Teo, Teow Wee, Mahdavipour, Zeinab, Abdullah, Mohd Zaid

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In-line optical micro-crack detection system for solar wafers by Mahdavipour, Zeinab, Teo, Teow Wee, Abdullah, Mohd Zaid

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