Search Results - Maillou, J.G.

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    Excimer laser recrystallization of amorphous Si films characterized by grazing X-ray diffraction and optical reflectivity

    Excimer laser recrystallization of amorphous Si films characterized by grazing X-ray diffraction and optical reflectivity by Mathé, E.L., Maillou, J.G., Naudon, A., Fogarassy, E., Elliq, M., De unamuno, S.

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  2. 2
    Comparison between microscopical aspects of a-Si films crystallized by pulsed UV excimer laser and calculated temperature profiles

    Comparison between microscopical aspects of a-Si films crystallized by pulsed UV excimer laser and calculated temperature profiles by Maillou, J.G., Mathé, E.L., Desoyer, J.C., de Unamuno, S., Fogarassy, E.

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