Search Results - Malaurent, J.C.

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  1. 1
    In situ X-ray multilayer reflectometry based on the energy dispersive method

    In situ X-ray multilayer reflectometry based on the energy dispersive method by Malaurent, J.C, Duval, H, Chauvineau, J.P, Hainaut, O, Raynal, A, Dhez, P

    Published in Optics communications
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  2. 2
    X ray study of the atomic structure of amorphous hydrogenated silicon and germanium

    X ray study of the atomic structure of amorphous hydrogenated silicon and germanium by Mosseri, R., Malaurent, J.C., Sella, C., Dixmier, J.

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  3. 3
    Energy dispersive method used for non-specular X-ray scattering from multilayer structure

    Energy dispersive method used for non-specular X-ray scattering from multilayer structure by Malaurent, J.C., Dhez, P., Duval, H.

    Published in Optics communications
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  4. 4
    Multilayer reflectivity calculations applied to the Energy Dispersive Method

    Multilayer reflectivity calculations applied to the Energy Dispersive Method by Duval, H, Malaurent, J.C, Dhez, P, Duval, Ph

    Published in Optics communications
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  5. 5
    The determination of the period of magnetic multilayers by the X-ray energy dispersive diffraction method

    The determination of the period of magnetic multilayers by the X-ray energy dispersive diffraction method by Malaurent, J.C., Duval, H., Dhez, P.

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  6. 6
    X-ray diffraction and local order modelling of Ge xSe 1−x amorphous alloys

    X-ray diffraction and local order modelling of Ge xSe 1−x amorphous alloys by Malaurent, J.C., Dixmier, J.

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  7. 7
    X-ray diffraction and local order modelling of GexSe1−x amorphous alloys

    X-ray diffraction and local order modelling of GexSe1−x amorphous alloys by Malaurent, J.C., Dixmier, J.

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  8. 8
    X-ray diffractometry situ of evaporated thin films: application to amorphous tellurium

    X-ray diffractometry situ of evaporated thin films: application to amorphous tellurium by Malaurent, J.C., Dixmier, J.

    Published in Thin solid films
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  9. 9
    In situ X-ray diffractometry of evaporated thin films: Application to amorphous tellurium

    In situ X-ray diffractometry of evaporated thin films: Application to amorphous tellurium by Malaurent, J.C., Dixmier, J.

    Published in Thin solid films
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  10. 10
    Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector

    Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector by Dhez, P, Duval, H, Malaurent, J.C

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