Search Results - Malneedi, R

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    Low cost at-speed testing using On-Product Clock Generation compatible with test compression

    Low cost at-speed testing using On-Product Clock Generation compatible with test compression by Keller, B, Chakravadhanula, K, Foutz, B, Chickermane, V, Malneedi, R, Snethen, T, Iyengar, V, Lackey, D, Grise, G

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    Attacks and solutions on Aydos-Savas-Koc's wireless authentication protocol

    Attacks and solutions on Aydos-Savas-Koc's wireless authentication protocol by Mangipudi, K., Malneedi, N., Katti, R., Fu, H.

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