Search Results - Mamy Randriamihaja, Yoann

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  1. 1
    Microscopic scale characterization and modeling of transistor degradation under HC stress

    Microscopic scale characterization and modeling of transistor degradation under HC stress by Mamy Randriamihaja, Yoann, Huard, V., Federspiel, X., Zaka, A., Palestri, P., Rideau, D., Roy, D., Bravaix, A.

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  2. 2
    Bias-Induced Healing of V} Failures in Advanced SRAM Arrays

    Bias-Induced Healing of V} Failures in Advanced SRAM Arrays by Mann, Randy W., McMahon, William, Randriamihaja, Yoann Mamy, Yuncheng Song, Kallianpur, Ajay Anand, Sheng Xie, Gautam, Akhilesh, Versaggi, Joseph, Parameshwaran, Biju, Weintraub, Chad E.

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  3. 3
    Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model

    Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model by Garetto, Davide, Randriamihaja, Yoann Mamy, Zaka, Alban, Rideau, Denis, Schmid, Alexandre, Jaouen, Hervé, Leblebici, Yusuf

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  4. 4
    Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach-Part II: Transient Effects

    Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach-Part II: Transient Effects by Garetto, Davide, Randriamihaja, Y. M., Rideau, D., Zaka, A., Schmid, A., Leblebici, Y., Jaouen, H.

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  5. 5
    Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach-Part I: Impedance Analysis

    Modeling Stressed MOS Oxides Using a Multiphonon-Assisted Quantum Approach-Part I: Impedance Analysis by Garetto, Davide, Randriamihaja, Y. M., Rideau, D., Zaka, A., Schmid, A., Leblebici, Y., Jaouen, H.

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  6. 6
    Comparing defect characterization techniques with non-radiative multiphonon charge trapping model: AC analysis, trap-assisted-tunneling and charge pumping

    Comparing defect characterization techniques with non-radiative multiphonon charge trapping model: AC analysis, trap-assisted-tunneling and charge pumping by Garetto, Davide, Randriamihaja, Yoann Mamy, Rideau, Denis, Schmid, Alexandre, Jaouen, Hervé

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  7. 7
    Comparing defect characterization techniques with non-radiative multiphonon charge trapping model

    Comparing defect characterization techniques with non-radiative multiphonon charge trapping model by Garetto, Davide, Randriamihaja, Yoann Mamy, Rideau, Denis, Schmid, Alexandre, Jaouen, Hervé

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  8. 8
    AC analysis of defect cross sections using non-radiative MPA quantum model

    AC analysis of defect cross sections using non-radiative MPA quantum model by Garetto, D, Randriamihaja, Y M, Zaka, A, Rideau, D, Schmid, A, Jaouem, Hervé, Leblebici, Y

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  9. 9
    Small signal analysis of electrically-stressed oxides with Poisson-Schroedinger based multiphonon capture model

    Small signal analysis of electrically-stressed oxides with Poisson-Schroedinger based multiphonon capture model by Garetto, D, Randriamihaja, Y M, Rideau, D, Dornel, E, William, F C, Schmid, A, Huard, V, Jaouen, H, Leblebici, Y

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