Effect of infrared laser irradiation on electrical conductivity and ethanol sensitivity of sol-gel ZnO thin films by Gegova-Dzhurkova, R, Nesheva, D, Mihailov, V, Dzhurkov, V, Terziyska, P, Manolov, E

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Modification of surface morphology and lattice order in nanocrystalline ZnO thin films prepared by spin-coating sol–gel method by Gegova-Dzhurkova, R., Nesheva, D., Dzhurkov, V., Šćepanović, M., Grujić-Brojčin, M., Bineva, I., Mihailov, V., Levi, Z., Manolov, E., Popović, Z. V.

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Selective photosensitivity of metal–oxide–semiconductor structures with SiOx layer annealed at high temperature by Paz, J., Nedev, N., Nesheva, D., Curiel, M., Manolov, E., Valdez, B., Perez, O., Mateos, D., Nedev, R., Arias, A., Ramirez, M., Dzhurkov, V.

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Investigation of resistive switching in SiO2 layers with Si nanocrystals by Manolov, E, Paz-Delgadillo, J, Dzhurkov, V, Nedev, N, Nesheva, D, Curiel-Alvarez, M, Valdez-Salas, B

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C-reactive protein specifically binds to Fcγ receptor type I on a macrophage-like cell line by Tron, Kyrylo, Manolov, Dimitar E, Röcker, Carlheinz, Kächele, Martin, Torzewski, Jan, Nienhaus, G. Ulrich

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Resistive switching behavior of SiOx layers with Si nanoparticles by Nesheva, D, Pantchev, B, Nedev, N, Valdez, B, Manolov, E, Dzhurkov, V, Nedev, R

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High energy electron-beam irradiation effects in Si-SiOx structures by Nesheva, D, Dzhurkov, V, Š epanovi, M, Bineva, I, Manolov, E, Kaschieva, S, Nedev, N, Dmitriev, S N, Popovi, Z V

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Preparation and characterization of SnO2 films for sensing applications by Stefanov, P, Atanasova, G, Manolov, E, Raicheva, Z, Lazarova, V

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Memory effect in MIS structures with amorphous silicon nanoparticles embedded in ultra thin SiOx matrix by NESHEVA, D, NEDEV, N, MANOLOV, E, BINEVA, I, HOFMEISTER, H

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TEM and Spectroscopic Ellipsometry studies of multilayer gate dielectrics containing crystalline and amorphous Si nanoclusters by Mateos, D., Curiel, M.A., Nedev, N., Nesheva, D., Machorro, R., Manolov, E., Abundiz, N., Arias, A., Contreras, O., Valdez, B., Raymond, O., Siqueiros, J.M.

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Absorption and transport properties of Si rich oxide layers annealed at various temperatures by Nesheva, D, Nedev, N, Levi, Z, Brüggemann, R, Manolov, E, Kirilov, K, Meier, S

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Costs Associated with the Treatment of Low Back Disorders: A Comparison of Surgeons and Physiatrists by Standaert, Christopher J., Li, Justin W., Glassman, Stuart J., Manolov, Nikolay E., Thomas, Santhosh A., Lee, Anthony A., Dolak, Melanie A., Stinneford, M. Kate

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Quartz roughness affect on W03 coated QCM by Georgieva, V, Raicheva, Z, Grechnikov, A, Gadjanova, V, Atanassov, M, Lazarov, J, Manolov, E

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Electrical characterization of MOS structures with self-organized three-layer gate dielectric containing Si nanocrystals by Nedev, N, Nesheva, D, Curiel, M, Manolov, E, Petrov, I, Valdez, B, Bineva, I

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Microstructural characterization of thin SiO x films obtained by physical vapor deposition by Curiel, M.A., Nedev, N., Nesheva, D., Soares, J., Haasch, R., Sardela, M., Valdez, B., Sankaran, B., Manolov, E., Bineva, I., Petrov, I.

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MOS structures containing silicon nanoparticles for memory device applications by Nedev, N, Nesheva, D, Manolov, E, Brüggemann, R, Meier, S, Levi, Z, Zlatev, R

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Effect of oxygen to argon ratio on the properties of thin SiOx films deposited by r.f. sputtering by Terrazas, J. M., Nedev, N., Manolov, E., Valdez, B., Nesheva, D., Curiel, M. A., Haasch, R., Petrov, I.

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Influence of the rapid thermal annealing on the properties of a-C:H/c-Si structures by Georgiev, S, Szekeres, A, Vlaikova, E, Beshkov, G, Sueva, D, Manolov, E

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Investigation of resistive switching in SiO 2 layers with Si nanocrystals by Manolov, E, Paz-Delgadillo, J, Dzhurkov, V, Nedev, N, Nesheva, D, Curiel-Alvarez, M, Valdez-Salas, B

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Influence of thermal annealing on the memory effect in MIS structures containing crystalline Si nanoparticles by Nedev, N, Nesheva, D, Manolov, E, Bruggemann, R, Meier, S, Kirilovc, K, Levi, Z

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