Search Results - Manson-Smith, S. K.

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  1. 1
    Characterization of nitride thin films by electron backscatter diffraction

    Characterization of nitride thin films by electron backscatter diffraction by Trager‐Cowan, C., Sweeney, F., Hastie, J., Manson‐Smith, S. K., Cowan, D. A., McColl, D., Mohammed, A., O’Donnell, K. P., Zubia, D., Hersee, S. D., Foxon, C. T., Harrison, I., Novikov, S. V.

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  2. 2
    Scanning Tunneling Luminescence Studies of Nitride Semiconductor Thin Films under Ambient Conditions

    Scanning Tunneling Luminescence Studies of Nitride Semiconductor Thin Films under Ambient Conditions by Manson-Smith, S.K., Trager-Cowan, C., O'Donnell, K.P.

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  3. 3
    Characterisation of nitride thin films by electron backscattered diffraction

    Characterisation of nitride thin films by electron backscattered diffraction by Trager-Cowan, C, Manson-Smith, S.K, Cowan, D.A, Sweeney, F, McColl, D, Mohammed, A, Timm, R, Middleton, P.G, O'Donnell, K.P, Zubia, D, Hersee, S.D

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  4. 4
    Cathodoluminescence from an InGaN/GaN MQW Grown on an Epitaxially Laterally Overgrown GaN Epilayer

    Cathodoluminescence from an InGaN/GaN MQW Grown on an Epitaxially Laterally Overgrown GaN Epilayer by Trager-Cowan, C., Osborne, I., Barisonzi, M., Manson-Smith, S.K., O'Donnell, K.P., Jacobs, K., Moerman, I., Demeester, P.

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  5. 5
    Probing Nitride Thin Films in 3-Dimensions using a Variable Energy Electron Beam

    Probing Nitride Thin Films in 3-Dimensions using a Variable Energy Electron Beam by Trager-Cowan, Carol, McColl, D., Sweeney, F., Grimson, S. T. F., Treguer, J-F., Mohammed, A., Middleton, P. G., Manson-Smith, S. K., O’Donnell, K. P., Van der Stricht, W., Moerman, I., Demeester, P., Wu, M. F., Vantomme, A., Zubia, D., Hersee, S. D.

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